 |
 |
Area della Ricerca di Padova
|
Industrial applications of x-ray diffraction /
Normal View ISBD View
Authors:
Chung, Frank H.
|
Smith, Deane K.
Published by :
Marcel Dekker inc.,
(New York : )
Physical details: XIV, 1006 p. : ill. ; 26 cm.
Subject(s):
Diffraction analysis
Year : 2000
No tags for this title.
| Item type | Location | Call Number | Copy | Status | Notes | Date Due |
|---|---|---|---|---|---|---|
| Books | Istituto di chimica e tecnologie inorganiche e dei materiali avanzati | edifico 6 (Browse Shelf) | 1 | Available | Biblioteca |
Browsing Istituto di chimica e tecnologie inorganiche e dei materiali avanzati Shelves Close Shelf Browser
Important links here.
There are no comments for this item.