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Vol. 8: Proceedings of the eighth international conference on Secondary Ion Mass Spectrometry (SIMS VIII) : International congress centre RAI, Amsterdam, The Netherlands, september 15-20th, 1991 /
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Authors:
Benninghven, A
|
Janssen, K.T.F.
|
Tumpner, J.
|
Werner, H.W.
Published by :
John Wiley & Sons,
(Chichester : )
Physical details:
XXV, 913 p. : ill. ; 24 cm.
Year :
1992
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Istituto di polarografia ed elettrochimica preparativa
452/VIII (
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451
A user's guide to vacuum technology /
452/VI
Vol. 6: SIMS VI : proceedings of the sixth International Conference on Secondary Ion Mass Spectrometry (SIMS VI), Palais des Congres, Versailles, Paris, France, september 13-18th, 1987 /
452/VII
Vol. 7: SIMS VII : proceedings of the seventh International Conference on Secondary Ion Mass Spectrometry (SIMS VII), Hyatt Regency Hotel, Monterey, California, USA, september 3rd-8th, 1989 /
452/VIII
Vol. 8: Proceedings of the eighth international conference on Secondary Ion Mass Spectrometry (SIMS VIII) : International congress centre RAI, Amsterdam, The Netherlands, september 15-20th, 1991 /
454
Mass spectrometry : applications in science and engineering /
455
The physics of amorphous solids /
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