Secondary ion mass spectrometry : a pratical handbook for depth profiling and bulk impurity analysis / ; By Wilson, R.G.
| Copyright: | 1989 |
|---|---|
| ISBN: | 0471519456 |
| Publisher: | New York : John Wiley & Sons, |
| Physical Details: | (paginazione varia) : ill. ; 25 cm. |
| Record No.: | 5012 |
| Type/Format | Call Number | Location | Due Date | Last Seen | Barcode |
|---|---|---|---|---|---|
 Books |
517 | Istituto di polarografia ed elettrochimica preparativa | 2010-04-13 | IPELP601 | |
| Books |
664 | Istituto di polarografia ed elettrochimica preparativa | 2010-04-13 | IPELP739 |