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Vol. 4 - Trace analysis
by Lawrence, James F.
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Orlando : Academic Press, 1985
. XII, 305 p. :
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Vol. 1
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Piscataway : IEEE 1994
. XXXIV, 711 p. ;
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Vol. 1
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New York : IEEE, 1991
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Vol. 1
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New York : IEEE, 1982
. XXXI, 509 p. :
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Vol. 5
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New York : IEEE, 1991
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Vol. 4
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New York : IEEE, 1991
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Vol. 3
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New York : IEEE, 1991
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Vol. 2
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New York : IEEE, 1991
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Vol. 3
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New York : IEEE, 1982
. XXVI, P978-1386 p. :
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Vol. 2
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New York : IEEE, 1982
. XXXI, P510-977 p. :
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Vol. 3
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Piscataway : IEEE 1994
. P. 1459-2118 ;
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Vol. 2
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Piscataway : IEEE, 1994
. P. 711-1458 ;
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Aerosols : an industrial and environmental science /
by Hidy, George M.
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Orlando : Academic Press, 1984
. XX, 774 p. :
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La regolazione automatica degli impianti industriali /
by Cesari, Orlando
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Milano : Franco Angeli, 1976
. 816 p. :
22 cm.
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An International Conference on Thermal Infrared Sensing for Diagnostics and Control (Thermosense IX) : 18-20 May 1987, Orlando, Florida /
by The Society of Photo-Optical Instrumentation Engineers
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Washington : SPIE - The International Society for Optical Engineering, 1987
. VI, 267 p. :
, SPIE = The Society of Photo-Optical Instrumentation Engineeers
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Thermosense XIV : International Conference on Thermal Sensing and Imaging Diagnostics Applications : 22-24 April 1992, Orlando, Florida /
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. VIII, 365 p. :
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Thermosense XIII : 3-5 April 1991, Orlando, Florida /
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Washington : SPIE - The International Society for Optical Engineering, 1991
. IX, 475 p. :
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Thermosense XII : International Conference on Thermal Sensing and Imaging Diagnostics Applications : 18-20 April 1990, Orlando, Florida /
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Washington : SPIE - The International Society for Optical Engineering, 1990
. VIII, 340 p. :
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International Conference on Thermal Infrared Sensing for Diagnostics and Control : Thermosense XI : 29-31 March 1989, Orlando, Florida /
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Washington : SPIE - The International Society for Optical Engineering, 1989
. VI, 203 p. :
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International Conference on Thermal Infrared Sensing for Diagnostics and Control (Thermosense X) : 5-8 April 1988, Orlando, Florida /
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Washington : SPIE - The International Society for Optical Engineering, 1988
. VIII, 215 p. :
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