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“au:Smith, Deane K. ”
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Industrial applications of x-ray diffraction /
Publication:
New York : Marcel Dekker inc., 2000 . XIV, 1006 p. : 26 cm.
Date:
2000
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A pratical guide for the preparation of specimens for x-ray fluorescence and x-ray diffraction analysis /
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New York : John Wiley & Sons, 1998 . XXIV, 333 p. : 24 cm
Date:
1998
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