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1. |
Computed emission tomography /
Publication:
Oxford ; New York : Oxford University Press, 1982
. XV, 546 p. :
24 cm.
Date:1982
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2. |
Atomic absorption and emission spectroscopy : analytical chemistry by open learning /
by Metcalfe, Ed
Publication:
Chichester : John Wiley & Sons, 1987
. XXI, 289 p. :
23 cm.
Date:1987
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Ufficio sicurezza e prevenzione
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3. |
Handbook of x-rays : for diffraction, emission, absorption and microscopy /
by Kaelble, Emmett F.
Publication:
New York : McGraw-Hill Book C., 1967
. X, (paginazione varia) :
24 cm.
Date:1967
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Istituto di chimica e tecnologie inorganiche e dei materiali avanzati
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4. |
X-ray emission spectrography in geology /
by Adler, Isidore
Publication:
Amsterdam : Elsevier Publishing Company, 1966
. XII, 258 p. :
22 cm.
Date:1966
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Istituto di ricerca per la protezione idrogeologica nei bacini dell'Italia nord-
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5. |
Ion formation from organic solids : proceedings of the second International Conference, Munster, Fed. Rep. of Germany, September 7-9, 1982 /
Publication:
Berlin : Springer-Verlag, 1983
. IX, 269 p. :
24 cm.
Date:1983
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Istituto di polarografia ed elettrochimica preparativa
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6. |
Continuous emission monitoring
by James A. Jahnke
Publication:
New York : John Wiley & Sons 2000
. XI, 404 p. :
24 cm
Date:2000
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7. |
ASHRAE guideline : reducing emission of fully halogenated chlorofluorocarbon (CFC) refrigerants in refrigeration and air-conditioning equipment and applications
by American Society of Heating, Refrigerating and Air-Conditioning Engineers
Publication:
Atlanta : ASHRAE, 1990
. 1 fascicolo (varie sequenze) ;
29 cm.
Date:1990
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Istituto per la tecnica del freddo
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8. |
Theory of reflectance and emittance spectroscopy /
by Hapke, Bruce
Publication:
New York : Cambridge University Press, 1993
. XIII, 455 p. :
26 cm.
Date:1993
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