Normal View ISBD View

Vol. 4: SIMS IV : proceedings of the fourth International Conference, Osaka, Japan, November 13-19, 1983 / edited by A. Benninghoven, J. Okano, R. Shimizu, H. W. Werner Secondary Ion Mass Spectrometry - Berlin : Springer-Verlag, 1984 - XV, 503 p. : ill. ; 24 cm. - Springer series in chemical physics ; 36 .

ISBN: 354013316X

Subjects--Topical Terms:
Secondary ion mass spectrometry