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Beam effects, surface topography, and depth profiling in surface analysis /

by Czanderna, Alvin W.
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Series: Methods of surface characterization Published by : Plenum Press, (New York : ) Physical details: xix, 430 p. : ill. ; 23 cm. Collection: Methods of surface characterization volume 5 Year : 1998
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Item type Location Call Number Copy Status Notes Date Due
Books Istituto di polarografia ed elettrochimica preparativa 765 (Browse Shelf) 1 Available Tolstogouzov

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