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Secondary ion mass spectrometry : a pratical handbook for depth profiling and bulk impurity analysis /
by Wilson, R.G.
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Authors:
Stevie, F. A.
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Magee, C. W.
Published by :
John Wiley & Sons,
(New York : )
Physical details: (paginazione varia) : ill. ; 25 cm.
Year : 1989
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