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Vol. 6: SIMS VI : proceedings of the sixth International Conference on Secondary Ion Mass Spectrometry (SIMS VI), Palais des Congres, Versailles, Paris, France, september 13-18th, 1987 /

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Authors: Benninghoven, A. | Huber, A. M. | Werner, H. W. Published by : John Wiley & Sons, (Chichester : ) Physical details: XXVII, 1078 p. : ill. ; 24 cm. Collection: Secondary ion mass spectrometry Subject(s): Secondary ion mass spectrometry Year : 1988
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Books Istituto di polarografia ed elettrochimica preparativa 452/VI (Browse Shelf) 1 Available DAOLIO

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