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261. |
Chemical, biological and industrial applications of infrared spectroscopy /
Publication:
Chichester : John Wiley & Sons, 1985
. XVIII, 399 p. :
24 cm.
Date:1985
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262. |
Fusion energy /
by Gross, Robert A.
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New York : John Wiley & Sons, 1984
. XIII, 328 p. :
24 cm.
Date:1984
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263. |
Vol. 7: SIMS VII : proceedings of the seventh International Conference on Secondary Ion Mass Spectrometry (SIMS VII), Hyatt Regency Hotel, Monterey, California, USA, september 3rd-8th, 1989 /
Publication:
Chichester : John Wiley & Sons, 1990
. XXVII, 963 p. :
24 cm.
Date:1990
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264. |
The dynamic earth : an introduction to physical geology /
by Skinner, Brian J.
Publication:
New York : John Wiley and Sons, 1995
. XXV, 567 p. :
28 cm.
Date:1995
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265. |
Vol. 6: SIMS VI : proceedings of the sixth International Conference on Secondary Ion Mass Spectrometry (SIMS VI), Palais des Congres, Versailles, Paris, France, september 13-18th, 1987 /
Publication:
Chichester : John Wiley & Sons, 1988
. XXVII, 1078 p. :
24 cm.
Date:1988
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266. |
Measurement, statistics and computation : analytical chemistry by open learning /
by McCormick, David
Publication:
Chichester : John Wiley & Sons, 1987
. XX, 760 p. :
23 cm.
Date:1987
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267. |
Analysis of organic and biological surfaces /
by Echlin, Patrick
Publication:
New York : John Wiley & Sons, 1984
. X, 646 p. :
24 cm.
Date:1984
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268. |
The physics of amorphous solids /
by Zallen, Richard
Publication:
New York : John Wiley & Sons, 1983
. XI, 304 p. :
24 cm.
Date:1983
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269. |
Inorganic mass spectrometry /
by Adams, F.
Publication:
New York : John Wiley & Sons, 1988
. XI, 404 p. :
24 cm.
Date:1988
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270. |
A user's guide to vacuum technology /
by O'Hanlon, John F.
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New York : John Wiley & Sons, 1989
. XVII, 481 p. :
24 cm.
Date:1989
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271. |
Vol. 1: Auger and X-ray photoelectron spectroscopy /
by Briggs, D.
Publication:
Chichester : John Wiley & Sons, 1983
. XIV, 657 p. :
24 cm.
Date:1983
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272. |
Corrosion of stainless steels /
by Sedriks, A. John
Publication:
New York : John Wiley & Sons, 1979
. XV, 282 p. :
24 cm.
Date:1979
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273. |
Applied finite element analysis /
by Segerlind, Larry J.
Publication:
New York : John Wiley & Sons, 1976
. XIII, 422 p. :
24 cm.
Date:1976
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274. |
Refrigeration engineering /
by Macintire, H. J.
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New York : John Wiley & Sons, 1950
. X, 610 p. :
24 cm.
Date:1950
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275. |
Computer applications in geography /
by Mather, Paul M.
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Chichester : John Wiley & Sons, 1991
. XI, 257 p. :
23 cm.
Date:1991
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276. |
Grounding and shielding techniques in instrumentation /
by Morrison, Ralph
Publication:
New York : John Wiley & Sons, 1977
. XIII, 146 p. :
24 cm.
Date:1977
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277. |
Fundamentals of temperature, pressure and flow measurements /
by Benedict, Robert P.
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New York : John Wiley & Sons, 1969
. XIV, 353 p. :
24 cm.
Date:1969
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278. |
Physics of semiconductor devices /
by Sze, S.M.
Publication:
New York : John Wiley & Sons, 1981
. XII, 868 p. :
23 cm.
Date:1981
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279. |
Thermocouple temperature measurement /
by Kinzie, P. A.
Publication:
New York : John Wiley & Sons, 1973
. VIII, 278 p. :
24 cm.
Date:1973
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280. |
Handbook of static secondary ion mass spectrometry /
by Briggs, D.
Publication:
Chichester : John Wiley & Sons, 1989
. 156 p. :
31x22 cm.
Date:1989
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